Nionswift-instrumentation

Latest version: v23.1.0

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0.21.1

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- Fix 151. Properly calibrate subscan/line-scan during synchronized acquisition.
- Improve handling of partial acquisition, directing data to desired data item.
- Fix more acquisition graphic edge cases: graphics only on enabled context displays.
- Fix issue where acquisition graphics would not appear on new channels.

0.21.0

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- Fix sync issue with SI (prep scan after camera stopped).
- Require scan_module (scan device and settings) rather than scan_device to be registered.
- Improve progress bars for 1D line scans.
- Only remove graphics from active acquisition data items (fix 127).
- Enable graphics properly when switching projects (fix 133).
- Only invalidate context field of view, rotation, or center changes (fix 140).
- Retain probe position when disabling and re-enabling (fix 139).
- Check channel states for changes before rebuilding thumbnails to avoid flashing.
- Allow scan modules to supply their own control panel UI.
- Make fov_size_nm be a computed property representing fov with aspect ratio applied.
- Add pixel_size_nm and subscan_pixel_size_nm computed properties to frame parameters.
- Handle scan data calibrations when scan data is 1D. Pass through 3D.
- Add channel_indexes_enabled to frame parameters for future use.
- Enable support for Python 3.11.

0.20.8

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- Replace flyback_pixels property with calculate_flyback_pixels method.
- Change 2D ramp (tableau) to use relative control values, like 1D ramp.
- Fix regression in multiple shift EELS acquisition.
- Ensure live view calibrations are correct during synchronized acquisition.

0.20.7

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- Drift correction improvements, simplified UI. Work in progress.
- Performance and reliability improvements.

0.20.6

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- Fix calibration issue on view modes.

0.20.5

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- Improve error handling and reporting.
- Use a target size of 64x64 for drift tracking area.
- Allow camera device to supply its own calibrator object.
- Fix PMT issue when index >= 2.
- Allow camera device to specify desired exposure precision.
- Improve support for axis handling in STEM controller.

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