ToF-SIMS data are multi-dimensional and highly complex data, which often demand a lot of efforts for thorough analysis and interpretation. We have developed an open-source and free python library in order to perform high level data analysis on ToF-SIMS data, such as spectra, profiles and image plots (also with overlay) of any recorded channel, shifts correction, data reconstruction, PCA on images, and easy access to valuable information such as the emission current and the extractor voltage during the whole data acquisition time. The user can retrieve the spectra per pixel and per scan as well as the pixel order used in random acquisition mode, and perform stitching correction, data stretch, shear and rotation correction to cite only a few of the possibilities. The library permits to open without any format conversion the ITM and ITA files generated by the SurfaceLab© software from IONTOF, and provides numerous further functions used for other imaging techniques. It is thus suited for performing multi-techniques data analysis, for example ToF-SIMS / SPM combined analysis.